期刊簡介預(yù)計(jì)審稿時(shí)間： 較慢,6-12周

The Journal of Electronic Testing: Theory and Applications is an international forum for the dissemination of research and application information in the area of electronic testing. This is the only journal devoted specifically to electronic testing. The papers for publication in Journal of Electronic Testing: Theory and Applications are selected through a peer review to ensure originality, timeliness, and relevance. The journal provides archival material, and through its quick publication cycle, strives to bring recent results to researchers and practitioners. While it emphasizes publication of preciously unpublished material, conference papers of exceptional merit that require wider exposure are, at the discretion of the editors, also published provided they meet the journal's peer review standard. Journal of Electronic Testing: Theory and Applications also seeks clearly written survey and review articles to promote improved understanding of the state of the art.

Journal of Electronic Testing: Theory and Applications coverage includes, but is not limited to the following topics:

Testing of VLSI devices printed circuit boards, and electronic systems;

Testing of analog and digital electronic circuits;

Testing of microprocessors, memories, and signal processing devices;

Fault modeling;

Test generation;

Fault simulation;

Testability analysis;

Design for testability;

Synthesis for testability;

Built-in self-test;

Test specification;

Fault tolerance;

Formal verification of hardware;

Simulation for verification;

Design debugging;

AI methods and expert systems for test and diagnosis;

Automatic test equipment (ATE);

Test fixtures;

Electron Beam Test Systems;

Test programming;

Test data analysis;

Economics of testing;

Quality and reliability;

CAD Tools;

Testing of wafer-scale integration devices;

Testing of reliable systems;

Manufacturing yield and design for yield improvement;

Failure mode analysis and process improvement

《電子測試：理論與應(yīng)用雜志》是傳播電子測試領(lǐng)域研究和應(yīng)用信息的國際論壇。這是唯一一本專門針對電子測試的雜志?！峨娮訙y試：理論與應(yīng)用雜志》上發(fā)表的論文經(jīng)過同行評審，以確保原創(chuàng)性、及時(shí)性和相關(guān)性。該雜志提供檔案材料，并通過其快速的出版周期，努力將最新成果帶給研究人員和從業(yè)人員。雖然它強(qiáng)調(diào)發(fā)表珍貴的未發(fā)表材料，但需要更廣泛曝光的優(yōu)秀會(huì)議論文，只要符合該雜志的同行評審標(biāo)準(zhǔn)，編輯也會(huì)酌情發(fā)表。 《電子測試：理論與應(yīng)用雜志》還尋求清晰的調(diào)查和評論文章，以促進(jìn)對最新技術(shù)的更好理解。

《電子測試：理論與應(yīng)用雜志》的報(bào)道包括但不限于以下主題：

VLSI 設(shè)備印刷電路板和電子系統(tǒng)的測試；

模擬和數(shù)字電子電路的測試；

微處理器、存儲(chǔ)器和信號(hào)處理設(shè)備的測試；

故障建模；

測試生成；

故障模擬；

可測試性分析；

可測試性設(shè)計(jì)；

可測試性綜合；

內(nèi)置自測試；

測試規(guī)范；

容錯(cuò)；

形式驗(yàn)證硬件；

驗(yàn)證模擬；

設(shè)計(jì)調(diào)試；

測試和診斷的人工智能方法和專家系統(tǒng)；

自動(dòng)測試設(shè)備（ATE）；

測試夾具；

電子束測試系統(tǒng)；

測試編程；

測試數(shù)據(jù)分析；

測試經(jīng)濟(jì)性；

質(zhì)量和可靠性；

CAD 工具；

晶圓級(jí)集成器件測試；

可靠系統(tǒng)測試；

制造良率和良率改進(jìn)設(shè)計(jì)；

故障模式分析和工藝改進(jìn)

《Journal Of Electronic Testing-theory And Applications》(電子測試?yán)碚撆c應(yīng)用雜志)編輯部通訊方式為SPRINGER, VAN GODEWIJCKSTRAAT 30, DORDRECHT, NETHERLANDS, 3311 GZ。如果您需要協(xié)助投稿或潤稿服務(wù)，您可以咨詢我們的客服老師。我們專注于期刊咨詢服務(wù)十年，熟悉發(fā)表政策，可為您提供一對一投稿指導(dǎo)，避免您在投稿時(shí)頻繁碰壁，節(jié)省您的寶貴時(shí)間，有效提升發(fā)表機(jī)率，確保SCI檢索（檢索不了全額退款）。我們視信譽(yù)為生命，多方面確保文章安全保密，在任何情況下都不會(huì)泄露您的個(gè)人信息或稿件內(nèi)容。